Items by "Angerer, Christoph"

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Conference or Workshop Item

Angerer, Christoph and Holzer, Martin and Knerr, Bastian and Rupp, Markus (2010) A Flexible Dual Frequency Testbed for RFID. In: 4th International ICST Conference on Testbeds and Research Infrastructures for the Development of Networks & Communities.

This list was generated on Mon May 4 10:32:40 2026 UTC.