Reliability and Mean Time to System Failure of a Parallel System' by Using One or Two Decimal Random Data Points

Kaur, H and Sharma, S K (2024) Reliability and Mean Time to System Failure of a Parallel System' by Using One or Two Decimal Random Data Points. EAI Endorsed Transactions on Scalable Information Systems.

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Abstract

Focusing on Weibull failure rules, which govern the stopping of components, this work evaluates reliability metrics such as stability and the mean time to system failure (MTSF) of a structure that is parallel. These metrics' behaviour has been seen for one or two decimal random values of component f

Item Type: Article
Date Deposited: 04 Mar 2026 18:29
Last Modified: 10 Apr 2026 23:07
URI: http://eprints.eai.eu/id/eprint/52710

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