Nirmalkumar, P and Mythily, K and Jose, Deepa and Kumar, B Arun (2023) Fault Detection and Analysis in SRAM through Self Refreshing Operation. EAI Endorsed Transactions on Scalable Information Systems.
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Abstract
Numerous soft faults in SRAM memory emerge as technological innovations scales down, resulting in single and several cell upsets. The increased use of transistors in space applications has rendered semiconductor devices more vulnerable to soft errors caused by harm from radiation. A single event ups
| Item Type: | Article |
|---|---|
| Date Deposited: | 04 Mar 2026 18:29 |
| Last Modified: | 10 Apr 2026 23:12 |
| URI: | http://eprints.eai.eu/id/eprint/52662 |
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