Stanisavljevic, Milos and Gürkaynak, Frank Kagan and Schmid, Alexandre and Leblebici, Yusuf and Gabrani, Maria (2010) A 90nm CMOS cryptographic core with improved fault-tolerance in presence of massive defect density. In: 2nd Internationa ICST Conference on Nano-Networks.
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Abstract
This paper presents the development methodology, circuit realization and measurement of a cryptographic core intended to operate reliably in the presence of massive defect density. A circuit-level voter based on averaging and thresholding has been implemented, and is measured to offer superior relia
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Date Deposited: | 04 Mar 2026 09:19 |
| Last Modified: | 18 Apr 2026 06:33 |
| URI: | http://eprints.eai.eu/id/eprint/5169 |
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