Mangayarkarasi, P and K, Arunkumar and Albert, Anitha Juliette (2024) Design and Comparison of SEU Tolerant 10T Memory Cell for Radiation Environment Applications. EAI Endorsed Transactions on Energy Web.
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Abstract
Single event upsets (SEUs), which are caused by radiation particles, have emerged as a significant concern in aircraft applications. Soft mistakes, which manifest as corruption of data in memory chips and circuit faults, are mostly produced by SEUs. The utilization of SEUs can have both advantageous
| Item Type: | Article |
|---|---|
| Date Deposited: | 04 Mar 2026 18:11 |
| Last Modified: | 11 Apr 2026 00:27 |
| URI: | http://eprints.eai.eu/id/eprint/51547 |
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