Mu, Yihui (2024) Design Analysis of Radiation Hardened Integrated Circuits Using Nanotechnology. In: Proceedings of the First International Conference on Science, Engineering and Technology Practices for Sustainable Development, ICSETPSD 2023, 17th-18th November 2023, Coimbatore, Tamilnadu, India.
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Abstract
As the manufacturing process of integrated circuits advances to the nanometer level, the integration and complexity of integrated circuits have been greatly improved. In various electronic devices, the working environment of integrated circuits is getting worse and worse. Radiation effect is one of
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Date Deposited: | 04 Mar 2026 17:09 |
| Last Modified: | 17 Apr 2026 00:38 |
| URI: | http://eprints.eai.eu/id/eprint/47066 |
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