Automatic Attendance Monitoring System Using Deep Learning

M, Shanmuhappriya and G, Sudha Sadhasivam (2021) Automatic Attendance Monitoring System Using Deep Learning. In: Proceedings of the First International Conference on Combinatorial and Optimization, ICCAP 2021, December 7-8 2021, Chennai, India.

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Abstract

The manual method of attendance management is time consuming and difficult to maintain. So, the process of management of attendance in schools and universities should be automated. Many biometric systems can be used to record attendance. Face recognition is used frequently. The proposed work aims to

Item Type: Conference or Workshop Item (UNSPECIFIED)
Date Deposited: 04 Mar 2026 14:56
Last Modified: 17 Apr 2026 07:06
URI: http://eprints.eai.eu/id/eprint/37175

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