Voyiatzis, I. and Kavvadias, D. and Antonopoulou, H. and Sinitos, S. (2010) Reliability Considerations in Mobile Devices. In: 3rd International ICST Conference on Mobile Multimedia Communications.
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Abstract
The problem of reliability in current chips has been the subject of numerous researchers. Mobile devices, commonly used in multimedia communications require low power during both normal operation and testing. In this paper a novel algorithm is presented for embedding test sets containing don't care
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Date Deposited: | 04 Mar 2026 09:05 |
| Last Modified: | 18 Apr 2026 06:43 |
| URI: | http://eprints.eai.eu/id/eprint/3535 |
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