zixuan, wang and Chengyuan, Li and Yifan, Zhang and Fan, Zhang and Shuo, Chang and Yilei, Li (2020) Improved Loss Function for Defect Detection of Mobile Phone Screen. In: Proceedings of the 13th EAI International Conference on Mobile Multimedia Communications, Mobimedia 2020, 27-28 August 2020, Cyberspace.
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Abstract
Due to the excellent feature learning and representation capabilities of deep learning, the method based on deep learning for mobile phone screen defect detection is gradually being applied to industrial detection. Nowadays, the cross-entropy loss commonly used in deep learning only focuses on the d
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Date Deposited: | 04 Mar 2026 13:46 |
| Last Modified: | 17 Apr 2026 09:59 |
| URI: | http://eprints.eai.eu/id/eprint/31502 |
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