Transfer Learning Based Screen Defect Classification

Yilei, Li and Chengyuan, Li and Yifan, Zhang and Shuo, Chang and Fan, Zhang and zixuan, wang (2020) Transfer Learning Based Screen Defect Classification. In: Proceedings of the 13th EAI International Conference on Mobile Multimedia Communications, Mobimedia 2020, 27-28 August 2020, Cyberspace.

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Abstract

For the screen defect classification, human inspectors and traditional machine
learning algorithms are inefficient and inaccurate. Convolutional neural network (CNN)
driven by data are feasible solutions. However, real training images are limited in the
industrial scenario, which causes overfitting.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Date Deposited: 04 Mar 2026 13:46
Last Modified: 17 Apr 2026 09:59
URI: http://eprints.eai.eu/id/eprint/31501

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