Singh, Ramya and Kumar, Gaurav and Sultania, Gaurav and Agashe, Shashank and Sinha, Priya and Kang, Chulmoo (2019) Deep Learning based MURA Defect Detection. EAI Endorsed Transactions on Cloud Systems.
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Abstract
INTRODUCTION: MURA defects in LED/LCD panels are one of the most challenging defects for Automatic Defect Classification and Localization (ADC) due to their extremely low contrast when compared with the background. Manual detection is subjective, error prone, very tedious and time consuming. Even wh
| Item Type: | Article |
|---|---|
| Date Deposited: | 04 Mar 2026 12:49 |
| Last Modified: | 12 Apr 2026 01:24 |
| URI: | http://eprints.eai.eu/id/eprint/26631 |
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